Bruker Dimension XR SPM
Microscope
This microscope has attachments for atomic force and magnetic force measurements. Peak-force tapping mode can be used for nanometer resolution of mechanical properties. In addition, the system can also do scanning electrochemical microscopy. AFM Contact Mode & Tapping Mode Conductive Atomic Force Microscopy (C-AFM) PeakForce Tunneling AFM (PFTUNA) PeakForce Quantitative Nanomechanics (PFQNM) PeakForce Scanning Electrochemical Microscopy (PFSECM) AFM nano-Dynamic Mechanical Analysis (AFM-nDMA)
| Service | Academic Rate | External Grant Rate | External Rate |
| Hourly Usage | 20.00 | 60.00 | 120.00 |
| Training | 50.00 | 100.00 | 150.00 |
| Sample | 100.00 | 100.00 | 150.00 |
| Technical | 200.00 | 200.00 | 250.00 |
Location:
Science Hall, Room 109