FEI Apreo S SEM
Microscope
This electron microscope has detectors for back-scattered electrons and secondary electrons. It also has an Oxford AZTEC EDS detector and a STEM detector for transmission measurements. Studies can be done at higher pressures with an electrically conducting atmosphere for better imaging of insulating samples. Schottky FIeld Emission Electron Source NiCol Electron Column Immersion Lens Trinity Detector System (T1, T2, T3) Low-vacuum Secondary Electron Detector Backscatter Detector Scanning Transmission Electron Microscopy Detector (STEM) Beam Deceleration Capabilities Oxford XmaxN 50 Energy Dispersive Spectrometer (EDS) w/ AZTEC Software
| Service | Academic Rate | External Grant Rate | External Rate |
| Hourly Usage | 40.00 | 120.00 | 240.00 |
| Training | 50.00 | 100.00 | 150.00 |
| Sample | 100.00 | 100.00 | 150.00 |
| Technical | 200.00 | 200.00 | 250.00 |
Location:
Science Hall, Room 109