Panalytical Empyrean XRD
Physical Property Characterization Tool
This instrument has a variety of optics and stages to allow for investigations of bulk materials, thin films and nanomaterials such as powder diffraction, small angle scattering, texture mapping, reciprocal space mapping, stress measurements. Stages include a 5-axis cradle, a transmission stage, and a high-temperature furnace (1200°C). 2 kW Cu X-ray Source Single Bounce Parallel Beam and Double Bounce Monochromator Optics PIXCel3D 2D Solid-State Hybrid Pixel Detector Powder Diffraction Stage w/ Rotation 5-Axis Cradle (chi,phi,x,y,z) for Thin Film Measurements: symmetrical, asymmetrical and grazing incidence diffraction, x-ray reflectivity, texture, stress, rocking curves, fast reciprocal lattice maps Anton Paar HTK-1200 High-Temperature Furnace Microdiffraction Capillary HighScore Xpert Plus Analysis Software
| Service | Academic Rate | External Grant Rate | External Rate |
| Hourly Usage | 20.00 | 60.00 | 120.00 |
| Training | 50.00 | 100.00 | 150.00 |
| Sample | 100.00 | 100.00 | 150.00 |
| Technical | 200.00 | 200.00 | 250.00 |
Location:
Science Hall, Room 104