TA SDT Q650

Thermal Analysis Spectrometer

The TA Instruments Q650 Simultaneous DSC/TGA (SDT) is a thermal analysis system designed to measure both differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA) data simultaneously on a single sample. This dual capability allows researchers to evaluate both heat flow and weight changes as a function of temperature or time, providing a comprehensive understanding of material properties such as composition, phase transitions, thermal stability, and decomposition. The Q650 offers excellent sensitivity, precise temperature control, and a wide dynamic range, making it suitable for applications in polymers, pharmaceuticals, composites, and other advanced materials research. Simultaneous DSC and TGA measurements on a single sample for correlated thermal data Temperature range up to 1500°C for broad material characterization High-resolution balance for accurate mass change detection Precision furnace design for uniform heating and superior temperature control Multiple gas purge capability for oxidative and inert atmosphere studies

TA SDT Q650

Service Academic Rate External Grant Rate External Rate
Hourly Usage 40.00 80.00 100.00
Training 50.00 100.00 150.00
Sample 100.00 100.00 150.00
Technical 200.00 200.00 250.00

Location:
Science Hall, Room 327